LEE, MING CHE
National Taipei University of Education Graduate School of Computer Science Student
Email：leetony411@gmail.com
LIU, YUAN CHEN
National Taipei University of Education Graduate School of Computer Science Professor
Email：liu@tea.ntue.edu.tw
Abstract
This paper presents a new architecture for modern electronic product testing platform. Basically, using a low-cost-single-chip microcontroller, we design one IC testing board, one sensor testing board combined with temperature and humidity sensors, LCD and other environmental sensors. With IoT, designer can control and monitor the whole testing system in real time by personal computer or handheld devices such as mobile phones and panel.
The experimental results show that this proposed intelligent IC testing platform system can provide a low-cost and high-performance monitoring and testing system which is combined with the product information and network communications, and thus can be applied to modern IC manufacturing factory in the industry 4.0 upgrade.
Keywords :Testing Platform, Integrated circuit, Internet of Things (IoT), Industry 4.0